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The fabrication of the periodic array of hollow PBNAs based on secondary electron lithography was previously demonstrated [1, 2].
For sample-independent beam current monitoring and irradiation fluence measurement, indirect charge integration, based on secondary electron current measurement from a beam profilometer, is utilized.
Figure 4 Scanning Electron Microscopy (SEM) based on secondary electron detection during imaging 100 μm wide regions of the as-received and the ground state of surfaces of SAE 1008/1010 steel.
Figure 9 Scanning Electron Microscopy (SEM) based on secondary electron detection during imaging 100 μm wide regions of the ground state of a carbon-fibre reinforced polymer (CFRP) surface.
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Based on secondary ion mass spectrometry analysis and scanning electron microscopy images of the surface, it was confirmed that the coating layer was successfully protected from the reactive electrolyte during storage at 90°C.
The article is based on secondary and publically available sources.
This analysis is based on secondary data.
First, the evaluation is retrospective based on secondary data.
This was a retrospective longitudinal study based on secondary data.
The principle of operation is based on the Secondary Electron Emission (SEE).
In this work, we present a series of computer simulations of a design based on the secondary electron emission from thin C-foils in transmission mode which shows that significant improvements in time resolution can be made with resolutions ∼200 ps being in principle possible.
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