Sentence examples for based on electron diffraction from inspiring English sources

A reinvestigation of form II, based on electron diffraction data and molecular modeling simulations, is reported.

But the best-final QSAR model is based on the Molecule Representation of Structures based on Electron diffraction (3D-MoRSE) descriptors capturing a reasonable interpretation.

The quantification of the structural features of 1,5-diarylpyrazole analogs with various biological activities gave some important structural insights, i.e. Hy (hydrophilic factor) and Mor17v (3D molecular representation of structure based on electron diffraction code).

The crystal structure of the Form II modification of isotactic poly(4-methyl-pentene-1) (P4MP1) is derived by molecular mechanics modeling based on electron diffraction patterns of single crystals and on earlier X-ray powder diffraction patterns.

The chain conformation and molecular packing of poly p-oxybenzoate) (poly p-oxybenzoatePpOBAure hate been deteroomed using computemperatureng and direct phaveng beendeterminedron diffraction data from lamellar and whisker single crystals.

Considering the setting temperature of 1,550°C (accuracy within ±50°C), the generated metallic sphere with a diameter of 143 ± 5 nm is presumably the molten phase based on electron diffraction pattern.

The recently developed method of five dimensional boundary analysis based on electron backscattering diffraction has been applied to these cases for the first time.

The presented study focuses on understanding the mechanisms for this ductility improvement by microstructure analysis, texture analysis and slip trace analysis based on electron backscatter diffraction and transmission electron microscopy.

The procedure is based on electron backscatter diffraction orientation map analyses carried out on different planes of deformed samples considering the evolution of the grain size and shape during severe plastic deformation.

In this work orientation imaging microscopy (OIM), based on electron backscatter diffraction in scanning electron microscopy, was employed to examine in detail the relationship between laser cladding processing parameters and he properties and the microstructure of single and overlapping laser tracks.

A method based on electron back-scattering diffraction (EBSD) measurements was used to identify activated slip systems.