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This included a backward digit span test from the Wechsler Memory Scale which requires participants to repeat a list of three to six words in length backwards [12].
Cognition measures included immediate and delayed word recall, forward and backward digit span test, and verbal fluency.
Working memory at age 8 was assessed using the backward digit span test and the arithmetic task from the WISC-III.
The exposed group performed less well in the backward digit span test than the referent group in a dose-effect manner.
The length of the longest series of digits recalled by a respondent in the correct sequence was taken as the score for the forward and backward digit span test (maximum possible score 9).
Conversely, SGA was significantly (all p < 0.005) associated with lower UNIT scores (−2.04 SE = 0.39); higher proportion failure on Stroop test (0.06, SE = 0.02); and lower scores on the backward digit span test (−0.16, SE = 0.04), MABC (0.98, SE = 0.25), and finger tapping test (−0.66, SE = 0.22) after adjusting for confounders.
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Working memory was assessed by the Chinese version of the Letter-Number Span Test (Chinese LN span) [ 31] and the forward and backward digit span tests.
Working memory was measured using forward and backward digit span tests [ 28].
Attention and working memory was assessed using the Forward and Backward Digit Span tests from the WMS-R [ 27, 31].
In the forward and backward digit span tests, interviewers read sets of digits (of increasing lengths) at a set pace of 1/sec.
In the backward digit-span test, respondents were asked to repeat the numbers in reverse order (12).
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Justyna Jupowicz-Kozak
CEO of Professional Science Editing for Scientists @ prosciediting.com