The phrase "axis of substrate" is correct and usable in written English.
It can be used in contexts related to science, engineering, or design, particularly when discussing the orientation or alignment of a substrate material.
Example: "The researchers measured the stress distribution along the axis of substrate to determine its structural integrity."
Alternatives: "substrate alignment" or "substrate orientation".
An external magnetic field of 500 Oe was applied along the short axis of the substrate to induce in-plane uniaxial anisotropy as showed in Fig 1.
Molecular dynamics simulations involving the sub-nanoscale interface reveal a most favourable set of temperature independent orientations of the monolayer graphene sheet with an angle of ∽15° between its armchair direction and [010] axis of the silicon substrate.
Also, substrate temperatures of 100°C and below yield low density, polycrystalline films with in-plane texture of ±12° around the main crystal axis of the MgO substrate [18].
The distance between the target and the axis of the rotating substrate was 45 mm. Figure 1 Schematic of the experimental device used for the deposition process.
To further probe the details of the strained film structure, bright field TEM images were taken along the [100] zone axis of the Nb STO substrate of Film2 (see Supplementary Note and Figure S1 online).
In front of the active site, the wide inclination of the three NeuO monomers generates a platform, which is oriented perpendicular to the long axis of the donor-substrate binding tunnel (Figure 3A).
The results obtained from bright field electron microscopy and electron diffraction indicate that sPP crystals grow epitaxially on the oriented nylon-12 substrate with their c-axes ± 37° apart from the chain axis of the nylon-12 substrate.
But if the magnetization axis of the anisotropic magnet substrate is perpendicular to the heat flux direction of the laser melting solidification layer, c-axis texture of the columnar Nd2Fe14B grains in the layer can be obtained, which is the same as that of the substrate, if the laser scanning rate is not less than 25 μm·s−1.
The results showed that the as-deposited thin films were all textured along c-axis and perpendicular to the surface of substrate.
It is found that when the driving electric field direction is parallel to the crystallographic X-axis of the piezoelectric substrate, (yxl -17° LiNbO3 LFE bulk acoustic wave devices work on quasi-LFE mode.
