This phenomenon is generally attributed to reflection of incident sunlight by the dewdrops.
This coarsening behavior has been attributed to reflection of primary ions.
The four peaks positioned at 2θ values of 38.2°, 44.4°, 64.5°, and 77.4° could be attributed to the reflections of the (111), (200), (220), and (311) crystalline planes of cubic Au, respectively.
Several diffraction peaks of (012), (104), and (113) facets can be attributed to the reflection of Al2O3. Figure 2 shows the TEM (a and d), SAED (b and e), and HRTEM (c and f) images of the samples UD700 (left panel) and D700 (right panel).
The small values of reflectivity are attributed to the multiple reflections of incident photons which are important when the length of SiNWs film is important (38 μm during 50 min).
Addition losses were attributed to unwanted reflections at the cut plane resulting from the construction of the lens, the absorption of light by unwanted epoxy at the fiber/lens interface, and specular reflections at the inner and outer surface of the endoscope window.
Weak reflection at 2θ of 28.5°, detected in the XRD pattern, could be attributed to the (111) reflection of ZnS sphalerite phase.
The increase in crystallinity in the films was observed as a function substrate temperature, and for the films deposited at Ts = 473 K, the respective X-ray diffractogram exhibited relative broad and high intense characteristic diffraction peak at 2θ = 20.3°, which attributed to Bragg reflection from (001) lattice planes of orthorhombic V2O5.
This improvement of the microwave absorbing capacity was mainly attributed to the multi-reflection of microwaves between the layered interfaces.
AIx is a parameter based on the analysis of the pressure waveform and represents the ratio of augmented pressure (attributed to wave reflection) to pulse pressure.
