The key features are the loss of reflections due to molybdena which were present in the diffractogram of the precursor materials and the appearance of peaks at 2θ values corresponding to 34.5, 37.9, 39.5, 61.5, and 69.6° which can be attributed to reflections of the β form of Mo2C (Zhu et al. 2007).
Several diffraction peaks of (012), (104), and (113) facets can be attributed to the reflection of Al2O3. Figure 2 shows the TEM (a and d), SAED (b and e), and HRTEM (c and f) images of the samples UD700 (left panel) and D700 (right panel).
The four peaks positioned at 2θ values of 38.2°, 44.4°, 64.5°, and 77.4° could be attributed to the reflections of the (111), (200), (220), and (311) crystalline planes of cubic Au, respectively.
Weak reflection at 2θ of 28.5°, detected in the XRD pattern, could be attributed to the (111) reflection of ZnS sphalerite phase.
The small values of reflectivity are attributed to the multiple reflections of incident photons which are important when the length of SiNWs film is important (38 μm during 50 min).
The increase in crystallinity in the films was observed as a function substrate temperature, and for the films deposited at Ts = 473 K, the respective X-ray diffractogram exhibited relative broad and high intense characteristic diffraction peak at 2θ = 20.3°, which attributed to Bragg reflection from (001) lattice planes of orthorhombic V2O5.
AIx is a parameter based on the analysis of the pressure waveform and represents the ratio of augmented pressure (attributed to wave reflection) to pulse pressure.
After 7 days of reaction one major peak appeared, which was located at 32° and attributed to the (211) reflection of the newly formed apatite phase and some other weak peaks appeared (JCPDS number 9-0432) [ 28, 33].
This improvement of the microwave absorbing capacity was mainly attributed to the multi-reflection of microwaves between the layered interfaces.
