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In our experiments, the applied voltage did not exceed 500 V to prevent the field emission influence on the measurements of the laser assisted emission.
One can observe from Fig. 3 that the laser assisted emission has pulse energy threshold, which corresponds to the switching of the emission mechanism from multiphoton to thermionic as the pulse energy increases.
The obtained experimental results on the laser assisted emission from NCF can be analysed in the framework of the two-temperature model, which describes the observed phenomena in terms of coupling between electron and lattice systems of the graphite flakes that compose the NCF.
By using results of the performed experiment, we developed the two-temperature model of the assisted emission that takes into account laser heating of the electron ensemble and energy exchange with the lattice.
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We performed experimental and theoretical study of the laser assisted electron emission from nanocarbon films.
This paper reports experimental results and theoretical analysis aiming at the mechanism of the ultrashort laser pulse assisted electron emission from NCF.
The cross section of the splat substrate interface was studied using a focused ion beam (FIB) assisted Field Emission Scanning Electron Microscope (FE-SEM).
We performed laser assisted filed emission measurements at the angles of incidence of 90 and 45° for the fundamental (800 nm) and the second harmonic (400 nm) beams, which were cross-linear polarized.
The electronic sources based on laser assisted electron emission have found applications in different fields of science and technology including particle accelerators [1], free electron lasers [2], and modern photovoltaic systems [3].
The laser assisted electron emission has opened a way towards the time resolved electron microscopy [4, 5] because electrical gating and source control enable time resolution down to picoseconds, while using optical control enables creation of electron pulses with duration down to tens of femtoseconds [6].
Images were acquired via a JEOL-1530 Thermassistedisted field emission (TFE) Scanning electron microscope at 12 or 10 kV at the resolving powers indicated in the results.
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