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Similar approaches can be applied to scanning probe microscopy data [25, 28], albeit in this case the origin of the contrast is more complex.
This technique is particularly useful when applied to scanning electron micrographs that have been calibrated using atomic force microscopy (AFM) roughness data.
The process for generating the three-dimensional models from the base two-dimensional images was applied to scanning electron micrographs of titanium thin films, the data from which is presented in Figure 2.
Three-dimensional displacement maps were successfully applied to scanning electron micrographs of the surface of 150 nm-thick sputter-coated titanium films, at 30000×, 70000×, 90000× and 150000× magnifications (Figure 3, Additional file 1).
The central ideas of this kind of 2D crystallographic symmetry averaging have also been applied to scanning transmission electron microscopy (STEM) in order to increase the signal-to-noise ratio of Z-contrast imaging [10].
We also foresee that in future a combination of sliding FFT and NMF tools can be applied to scanning tunneling microscopy of quasiparticle interference patterns in strongly correlated electronic materials in which different coexisting phases (and/or different scattering centers) may produce several interference patterns with distinct symmetries within an experimental field of view.
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The presented setup was applied to scan the particle size range from 7 to 156 nm within 120 s.
Digital photogrammetry, applied to scanned archived photography, can be used to generate high-resolution (sub-meter) DEM surfaces of proglacial terrain suitable for quantifying decadal-scale morphometric changes that have occurred since the mid-20th century to recent times.
The structured-light sensor is usually applied to scan the profile of a part from different views, while the trigger probe is used to measure the edge and key features of the part.
The Wilcoxon signed rank test was applied to scan the variables between each measurement and the spearman rank correlation was used for non-parametric correlation analyses between different parameters.
The dN/dS ratio (non-synonymous substitutions per non-synonymous site divided by synonymous substitutions per synonymous site) is commonly applied to scan for evidence of positive selection in comparative genomic analysis [1], [2].
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