The phrase "and inspected using a" is correct and usable in written English.
It can be used when describing a process or method of examination or evaluation that involves a specific tool or technique.
Example: "The samples were collected and inspected using a microscope to ensure accuracy in the results."
Alternatives: "and examined with a" or "and assessed through a".
Slides were then mounted with an anti-fade agent (Molecular Probes P7481) and inspected using a Zeiss LSM 510 confocal laser scanning microscope (Carl Zeiss, Inc., Germany) set for excitation at 488 nm utilizing an argon/krypton laser.
For Scanning Electron Microscopy (SEM) pollen grains from homozygous ashh2 plants and wt pollen were harvested directly on a stub, coated with gold palladium in a sputter-coater, and inspected using a high-vacuum Scanning Electron Microscope (SEM) JEOL JSM 6400.
The samples were then mounted in Vectashield® Mounting Medium (Vector Laboratories) with DAPI and inspected using a Nikon E600W fluorescence confocal microscope (Nikon).
Sections were mounted on slot grids, stained with uranyl-acetate and lead-citrate and inspected using a JEOL JEM-1011 transmission electron microscope fitted with a GATAN digital camera.
DNA quality and concentration were inspected using a spectrophotometer (Nano Drop 1000, Thermo scientific, Wilmington, USA).
Total RNA was extracted using the RNeasy® Mini Kit (Qiagen), RNA quality and concentration was inspected using a Fragment Analyzer™ (Advanced Analytical Technologies , Inc.
The phase behaviour and morphology were closely inspected using a variety of techniques including wide angle X-ray diffraction, optical and scanning electron microscope and differential scanning calorimetry.
Giemsa-stained chromosomes and FISH images were inspected using a Provis AX70 Olympus microscope with a standard fluorescence filter set.
Samples of the isolated CM and PM were also inspected using a fluorescence microscope (BX60 with filter U-MWU, 330−385 nm excitation, ≥420 nm emission; Olympus Europa Holding GmbH, Hamburg, Germany) and a dissecting microscope (MZ10F with filter GFP-plus, 440−480 nm excitation, ≥510 nm emission; Leica Microsysteme GmbH, Wetzlar, Germany).
The size and morphology of the samples were inspected using a field emission transmission electron microscope (FE-TEM) equipped with an energy-dispersive X-ray spectrometer (EDX) (FE-TEM, JEM-2100F, JEOL, Akishima-shi, Japan) by operating at an accelerating voltage of 200 kV.
During the installation of the precast concrete facing panel, vertical and horizontal alignment of each panel was inspected using a spirit level.
