The phrase "and defect in the" is grammatically correct and can be used in written English.
It can be used in contexts discussing issues, flaws, or problems related to a specific subject or object.
Example: "The report highlighted several concerns, including a defect in the manufacturing process that needs immediate attention."
Alternatives: "and flaw in the" or "and issue in the".
A virtue is a kind of mean between excess and defect in the exercise of a power.
The thermal expansion coefficient of the SLNWs with a large bilayer thickness has weak temperature dependence, while that with a small bilayer thickness has strong temperature dependence and becomes weak upon annealing treatment, which clearly indicates that the stress and defect in the interface play a main role in determining the thermal contraction of the Bi/BiSb SLNWs.
The impact energy in the early freeze-thaw period lost the fastest and the most, indicating that the freeze-thaw cycles would produce damage and defect in the fiber/matrix interface and therefore made the fiber's three-dimensional system gradually lose its enhancement effect.
The hole-punched steel tubes had been special-ordered from a supplier in Omaha — at this stage in the revolution, off-the-shelf parts are another regretted necessity — and defects in the batch hampered the team's progress.
For example, the letter tells them to detail the risks associated with potentially higher loan repurchase requests and defects in the loan securitization process.
Dr. Nara Variankaval, Merck, discussed the distinction between the amorphous phase and defects in the solid.
The analysis has shown major destructive geological-engineering factors that cause deformations and defects in the bridge supports and spans.
Also, the effect of relative density and defects in the form of deformation on sub-ultrasound wave characteristics are explored.
The acquired signal can have information about tool life, quality of cutting and defects in the workpiece.
The changes in the dss and Tg, consequently, modify the silicon excess and defects in the non-stoichiometric SiO x films.
These changes in the dss and Tg, consequently, have modified the silicon excess and defects in the non-stoichiometric SiO x films.
