The phrase "analysis was characterized" is correct and usable in written English.
It can be used when describing the defining features or qualities of an analysis in a specific context.
Example: "The analysis was characterized by a thorough examination of the data and a clear presentation of the findings."
Alternatives: "the analysis was defined by" or "the analysis was marked by".
The shape and size of the CeF3 nano-particles and the surface topography of the composite coatings were observed using an environmental scanning electron microscope, and the component and structure analysis was characterized by means of XRD.
Final analysis was characterized by an intercoder agreement of 92.5%, meaning the researchers did not reach consensus on less than 8% of items coded.
Gene Ontology (http://geneontology.org) enrichment analysis was characterized by hypergeometric p-value, as described previously [91].
The subset of samples from tomato (K 1 in the initial analysis) was characterized best by four sub-clusters (K = 4).
The subset of samples collected from cucumber (K 2 and K 3 in the initial analysis) was characterized best by three well-resolved sub-clusters (K = 3), all with 85-100% assignment.
The subset of samples from greenhouses (K 2 and K 3 in the initial analysis) was characterized best by three well-resolved genetic sub-clusters (K = 3), with 71-98% assignment rate.
Five predominant fracture sets, with corresponding parameters of their respective spatial distributions that are determined by stereographic projection analysis and statistical analysis, are characterized to establish a model to characterize the fractures of fractured rock masses.
Metaphysical analysis is characterized here as the detection of 'absolute presuppositions', which are taken as underlying and shaping the various conceptual practices that can be identified in the history of philosophy and science.
Surface's morphology and microstructural analysis were characterized by scanning electron microscopy (SEM; FEI Quanta-200) and surface roughness by atomic force microscopy (AFM; Multimode 8 with Nanoscope® V).
