The phrase "analysis of the device" is correct and usable in written English.
It can be used when discussing the examination or evaluation of a particular device, often in a technical or scientific context.
Example: "The analysis of the device revealed several areas for improvement in its design and functionality."
Alternatives: "examination of the device" or "evaluation of the device".
Its $3.6 million contract for the forensic analysis of the device, which was set to expire Monday, has been extended.
Both the experimental demonstration and complementary analytical modeling support the hypothesis that the statistical analysis of the device can strengthen the credibility of the sensor constructed using nanomaterials with any imperfections.
Western bomb disposal technicians who reviewed the images for The New York Times said that a more thorough analysis of the device is difficult without more information, and that assessments of the bomb could change as the authorities analyze it further and if they collect more evidence.
For the analysis of the device in AM circuit the parameters studied are the bandwidth, the gain and the linearity, correspondingly for SRAM circuit the parameters studied are the Static Noise Margin (SNM) and the circuit delay.
In addition, a tolerance analysis of the device in terms of fabrication, illumination, alignment is discussed in detail to get a guidance of successful realization of an actual device.
The performances of the resulting devices (3 layer structures) were compared with that of conventional ones (5 layer structures) through the analysis of the device color contrast over time during continuous operation conditions using a cycling program.
The depletion capacitance analysis of this device revealed built in voltage values of 1.91 and 1.64 V at the Au and C sides, respectively.
Also, electron impedance spectroscopy (EIS) analysis of the devices gives a good explanation of the understanding of the cell performances.
It includes a thorough analysis of the devices steady-state and switching characteristics, as well as the investigation of short-circuit events.
Structural analysis of the devices is performed by scanning electron microscopy (SEM) of selected samples.
The traditional measurements of luminous intensity were complemented with the luminance analysis of the devices, evaluated for diverse angular fields.
