The phrase "an electron probe" is correct and usable in written English.
It can be used in scientific or technical contexts, particularly in discussions related to physics, chemistry, or materials science.
Example: "The researchers utilized an electron probe to analyze the material's surface structure at a microscopic level."
Alternatives: "an electron microscope" or "an electron beam probe".
Femtosecond tracking of an electron probe beam reveals correlated electronic and nuclear motion in laser-heated graphite.
In the 1970s, he played a central role in helping the museum get, through a grant from NASA, an electron probe micro-analyzer for minerals.
The effectiveness of the penetration was determined using an electron probe microanalyzer (EPMA).
Surface morphologies of chromized layers and matrix after wear and adhesion tests were studied with an electron probe microanalyzer.
The chemical compositions of Ta Zr Cu Al Ag TFMGs were examined by an electron probe microanalyzer (EPMA).
The coatings were characterized by means of an electron probe micro analyzer (EPMA) with wavelength dispersive X-ray spectrometers (WDS).
Fig. 2 a Electron probe intensity and b phase distribution obtained by correcting all the aberrations (up to the fifth order) of the electron optics (corrected probe).
CL was done at temperatures of 300 and 77 K in an electron-probe microanalyser Camebax supplied with the CL system.
Electron beam methods, such as cathodoluminescence (CL) that is based on an electron-probe microanalyser, and (200) dark field and high angle annular dark field (HAADF) in a scanning transmission electron microscope, are used to study the deterioration of interfaces in InGaP/GaAs system with the GaAs QW on top of InGaP.
We use an aberrated electron probe, which still maintains an atomic size, and detect the antiferromagnetic ordering of Mn moments in LaMnAsO by observing a dichroic signal in the Mn L-edge.
EMCD arising from magnetic moments aligned along the electron beam direction, in a crystal with in-plane fourfold symmetry, can be detected using an aberrated electron probe containing fourfold astigmatism (known as C34 in Krivanek's notation [10], or A3 in Haider's notation [11]).
