Sentence examples for an analysis of the device from inspiring English sources

The phrase "an analysis of the device" is correct and usable in written English.
You can use it when discussing or examining the features, functions, or performance of a specific device in a technical or academic context.
Example: "In this paper, we will conduct an analysis of the device to determine its efficiency and usability in various applications."
Alternatives: "a study of the device" or "an examination of the device".

Exact(1)

In addition, an analysis of the device has been conducted using this theoretical model for the device as installed in a prototype cycle as reported in a companion part I paper.

Similar(59)

An analysis of the procedural device prepared by Ms. Pelosi's office says, "Some opponents of reform are objecting to the process in an attempt to kill the bill".

Design specifications were formulated on the basis of an analysis of the context in which the device will be used.

From an analysis of the affordances and constraints of both devices this effect was expected to be stronger with the inhaler chamber than with the peak flow meter.

Using the average annual wave energy spectrum at this site as the input, the optimum structural geometric configuration was established, along with an analysis of the optimum configuration for different radius devices.

Measurements were made after 15 min supine rest with blood pressure recorded in triplicate by using an automated sphygmomanometer (Omron 705CP; Omron Healthcare); peripheral and central augmentation indexes were also determined with the SphygmoCor device by an analysis of the radial arterial waveform obtained by tonometry.

In addition, a tolerance analysis of the device in terms of fabrication, illumination, alignment is discussed in detail to get a guidance of successful realization of an actual device.

An example of how this "two strikes and you're out" rule works can be found in an analysis of medical device company Cyberonics.

It includes a thorough analysis of the devices steady-state and switching characteristics, as well as the investigation of short-circuit events.

As an application of the PS method, we determined micron order residual stress distributions in a model plastic encapsulated silicon substrate for microelectronic devices and compared the stress data with those calculated using a two-dimensional finite element analysis of the device.

An anemometer on the coast guard station measured a peak velocity of ; however, later analysis of the device revealed that it was broken and revolving slower than it should.

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