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Discover LudwigThe phrase "aid scanning" is correct and usable in written English.
It can be used in contexts related to providing assistance or support in the process of scanning, such as in technology or healthcare.
Example: "The new software is designed to aid scanning documents more efficiently."
Alternatives: "assist with scanning" or "support the scanning process."
Exact(2)
Tooth and condyle surfaces were coated with a light layer of talc or ammonium chloride (NH4Cl) to aid scanning.
To aid scanning, samples with the most similar amounts of Cy3 were grouped on the same slide.
Similar(58)
Moreover, Senavirathne and co-workers have observed that AID scans multiple times along the entire length of the ssDNA during a single binding event.
Meanwhile, the deterioration near crack tips of the corroded specimens was observed with the aid of scanning electronic microscopy (SEM).
The surface changes accompanying voltammetric scans were analysed with the aid of scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS).
With the aid of scanning electron microscopy (SEM), fractographic analyses were carried out on the fatigue specimens to determine the crack nucleating mechanism.
Metallographic and chemical characterization of the produced composite coatings was performed with the aid of Scanning Electron Microscopy (SEM) and Electron Dispersive X-ray Analysis (EDX).
Three different characteristic frequency bands were confirmed, corresponding to substrate deformation, surface vertical cracking and interface delamination, with the aid of scanning electronic microscopy observations.
The relative energies of 43 different large angle grain boundaries in Ni-rich NiAl have been determined with the aid of scanning probe microscopy using the thermal grooving method at 1400 °C.
In this article, tensile properties have been discussed in terms of phase morphology, crystallinity and molecular orientation in the HDPE/iPP blends, prepared via dynamic packing injection molding, with aid of scanning electron microscopy (SEM), differential scanning calorimetry (DSC) as well as two dimensional X-ray scattering (2D WAXS).
Quantitative fractography techniques have been implemented and frequently used in the Failure Analysis Laboratory – LANAF, at the Engineering School of São Carlos, for fatigue life estimations of structural components, whose fracture surfaces are subjected to detailed inspection with the aid of scanning electron microscopes.
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