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The electric study of films involves an original method of admittance vs frequency measurement.
The results have been represented in the form of conductance and susceptance spectra, ie plots of the real and imaginary components of the admittance vs. frequency.
The presence of an air leak can be reliably detected using low-frequency admittance phase or low-frequency absorbance.
Low-frequency admittance phase and CV/PV decreased, while low-frequency absorbance and the air-leak resonance frequency increased.
No change in the resonance admittance modulus versus frequency was observed.
Four acoustic metrics were used for predicting the presence of air leaks and for quantifying these leaks: (1) low-frequency admittance phase (averaged over 0.1 0.2 kHz), (2) low-frequency absorbance, (3) the ratio of compliance volume to physical volume (CV/PV), and (4) the air-leak resonance frequency.
Admittance measurements identified frequencies of electrical resonance.
So, the quantity corresponds to the equivalent low-frequency admittance.
CV becomes negative at large air-leak sizes, producing negative values of CV/PV, because our equation for computing CV assumes that low-frequency admittance is compliance-dominated and has a positive imaginary part.
While we do not actively source the idler current, we will find that the external admittance at the idler frequency, Y 2, effects response of the SQUID at the signal frequency in an important way.
We found the negative resistance responsible for gain was now dependent on the external circuit admittance at the idler frequency.
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