The phrase "accurate defects" is not correct and does not convey a clear meaning in written English.
It is contradictory because "accurate" implies correctness or precision, while "defects" refers to flaws or errors, making the combination confusing.
Example: "The report highlighted the accurate defects in the manufacturing process, which was misleading."
Alternatives: "specific flaws" or "identified errors."
The results exhibit accurate defect detection with low false alarms, thus showing the effectiveness and robustness of the proposed scheme.
Although those methods are well-known practical techniques, there exists a growing interest of developing the new and improved methods for evaluating the more accurate defect profiles of material systems.
The probe was designed with accurate defect characterization in view, i.e. to provide multi-frequency and high spatial resolution images with a reduced acquisition time, so as to enhance the informative content of the acquired eddy current data.
The present work could serve as a useful reference for accurate control of defects and microstructure in AM build.
The experimental evaluation of the probe provides promising prospects for the accurate characterization of defects, by means of advanced multifrequency signal processing algorithms.
In order to understand the defect forming mechanism, accurate 3D images of defects inside SLM fabricated Co Cr Mo samples were provided by synchrotron radiation micro-CT imaging of 300 μm thick slices cut from a 10 mm cube.
GRASP in no way guarantees that the data is complete, accurate, or without defect.
The analyses presented in this study are essential to develop accurate and reliable defect size estimation algorithms.
Additional, a three dimensional computer tomography was performed for all patients, with a glenoid rim fracture on plain radiographs, to evaluate an accurate measure of defect area.
An accurate electrical fault characterization is required for the correct diagnosis and localization of CMOS interconnect defects.
