The phrase "aberration of the sample" is correct and usable in written English.
It can be used in contexts related to statistics, research, or data analysis when referring to an anomaly or deviation observed in a sample.
Example: "The results showed an aberration of the sample that could not be explained by the standard deviation."
Alternatives: "anomaly in the sample" or "deviation from the sample".
Figure 6b shows significant decrease in the colour aberration of the samples with modified nano-TiO2.
The samples were placed for 1500 h in the chamber, and the time-dependent gloss retention and colour aberration of the samples across the ageing was measured.
The aberration positions of the sample containing fewer aberrations were randomly reordered, matched to a random set of aberration positions of the other sample, and the new number of matching positions (ri) was calculated.
Another effect might influence the accuracy of the results: theory indeed predicts that the average image intensity has a single maximum in the absence of aberrations independently of the sample structure under the assumption that the spatial variations of this structure are averaged during the calculation of M [ 4].
With the previous results we have shown the capability of the NL-GS methodology in situation where the main source of aberration is the sample (in this case the agar pad).
Secondly, measuring aberration maps within thick samples permits estimating the variation scale of aberrations within the sample.
Furthermore, the aberration maps of Fig. 5 show that aplanetism regions, where aberrations can be considered as spatially constant, are typically 50 100 μm in size at depth of several hundreds of microns, thereby enabling aberration correction on subregions of the sample.
S was prepared for l unpaired normal samples with the same procedure as that used for R, and T is unobserved data that we can obtain by removing false positive calls from R. We define the probability of aberration at the position i of the sample j as p ij =Pr(R ij =1), and use { p i 1, p i 2,…, p im } as the Poisson-binomial parameters.
In practice, measuring and correcting excitation beam aberrations at the sample plane of a nonlinear microscope is a difficult task.
Using PSI, the wavefront topography and hence the aberrations on the pupil p1 of the sample arm are measured.
