The phrase "a slit beam of" is correct and usable in written English.
It can be used to describe a narrow, focused beam of light, often in contexts related to photography, optics, or lighting design.
Example: "The artist used a slit beam of light to create dramatic shadows on the stage."
Alternatives: "a narrow beam of" or "a focused beam of".
In assessing the ACD with IOLMaster, a slit beam illumination at an angle of 30° is used which leads to lower resolution, reproducibility, and accuracy [ 6].
The slot-scan technology provides excellent scatter rejection by irradiating the body by a sliding slit beam instead of irradiating the whole body at once.
With the slit beam at a 45◦ angle, the slit height and width are adjusted to approximate the overall brightness of the corneal image and anterior subcapsular zone to nuclear color/opalescence standard N1; 0◦ brightness is allowed to visualize all the lens opacities without causing discomfort to the patient.
We have previously shown that lower fornix shortening is documented either subjectively or semi-objectively by utilising a slit-light beam, the degree of upper forniceal obliteration is seldom quantified.
The heterogeneous structuring of these polymeric systems (at the nanometer level) was studied via small-angle X-ray scattering (SAXS) with a CRM-1 camera (Orel scientific equipment factory, Russia), having a slit collimator of the primary irradiation beam made via the Kratky method.
This paper gives an overview of the development of a novel two-slit beam probing system that is simpler in design and can be used for high power welding applications.
When resolved by a spectroscope, the individual components of the radiation form images of the source (a slit through which the beam of radiation enters the device).
Using a focused ion beam (30 keV Ga+ ions, current 10 pA), we mill nine 18-μm-long slits in a single pass, creating eight nanomechanical beams, each separated by a slit width of 20 nm.
Chromatograms of the samples were scanned at 254 nm in the single-wavelength, single-beam mode with the TLC Scanning Densitometer with a slit setting of 7 mm length and 1 mm height.
The same interference pattern demonstrated in Young's double-slit experiment is produced when a beam of matter, such as electrons, impinges on a double-slit apparatus.
