The phrase "a scanning probe microscope" is correct and usable in written English.
It can be used when discussing scientific instruments used for imaging, measuring, and manipulating matter at the nanoscale.
Example: "The research team utilized a scanning probe microscope to analyze the surface properties of the material."
Alternatives: "a SPM" or "a probe microscope".
The generator is applied as a controller for an approach mechanism in a scanning probe microscope.
The AM-AFM measurements are performed by a scanning probe microscope (Bruker MultiMode) at a tapping mode with a Nanoscope V controller.
The researchers measured that force by attaching anti-VEGFR2 antibody molecules to the end of a cantilevered probe in a scanning probe microscope.
We show that the stripe-superlattices can be reproducibly and reversibly manipulated with submicrometre precision using a scanning probe microscope, allowing us to create arbitrary arrangements of frictional domains within a single flake.
The morphological analysis of the crosslinked material was investigated by scanning electron microscopy (SEM) and a scanning probe microscope with atomic force microscope (AFM) attachment.
P-Si(1 0 0) wafers were cleaned to obtain hydrogen-terminated surface and nanoscopic patterns were formed on the surface by nanoindentation technique using a scanning probe microscope (SPM) with a diamond probe.
This review covers three topics: a scanning probe microscope-based evaluation of individual molecules, nano-gap electrodes for electrical current through single-molecules and the incorporation of molecular functions into Si-based devices.
Until now, manipulating the nanoworld has been limited to pushing nanostructures around with the tip of a scanning probe microscope--an expensive and cumbersome piece of machinery that can only operate in two dimensions.
The stage has been designed to achieve a positioning accuracy of 10 nm and is used to position samples beneath a scanned probe microscope.
These pen arrays can be sprayed with different molecular inks on their tips, and then attached to the moving arm of a scanning-probe microscope to trace out designs.
All AFM measurements were made with a MultiMode scanning probe microscope with a Nanoscope IIIa controller (Veeco Instruments Inc, Santa Barbara, CA).
