The phrase "a scanning electronic microscope" is not correct in standard English; it should be "a scanning electron microscope." You can use it when referring to a type of microscope that uses a focused beam of electrons to create an image of a specimen.
Example: "The researchers used a scanning electron microscope to examine the surface structure of the material in detail."
Alternatives: "a scanning electron imager" or "an electron scanning microscope."
In a factory tour here last week, Intel used a scanning electronic microscope to display a computer chip made using the new 22-nanometer manufacturing process.
The surface integrity was examined using a scanning electronic microscope (SEM).
The wear mechanism of the worn surface was studied through a scanning electronic microscope.
In addition, composite mortars were analysed using a Scanning Electronic Microscope (SEM).
Fracture surfaces of all the failed specimens were examined in a scanning electronic microscope (SEM).
Surface state was acquired by a scanning electronic microscope (SEM) and an optical microscope (OM).
A boronized layer of Cr12MoV steel was processed with LQ (laser quenching), and the fatigue limits of original samples before and laser quenched samples were calculated with Locati tension tension fatigue test, and the fracture morphologies were observed with a SEM (scanning electronic microscope).
Single crystalline Si grains with an average size of 10 μm were obtained and further characterized by an optical microscope, scanning electronic microscope (SEM) and Raman spectrometer.
These thicknesses could be observed from Figure 1b that shows the cross-section of a typical device by scanning electronic microscope (SEM).
After pre-treated by spraying gold on the films of samples, SEM measurements were carried out using a SIRION field emission scanning electronic microscope (FEI Corporation Ltd., Hillsboro, OR, USA) with accelerating voltage of 10.0 kV.
A FEI QUANTA 600 (Hillsboro, OR, USA) environmental scanning electronic microscope (ESEM) and a JEOL JEM-1011 transmission electron microscope (TEM) with MegaView III (Soft Imaging System, Olympus, Tokyo, Japan) were used to study particle homogeneity, morphology, and size dispersion.
