The phrase "a method of incorporating" is correct and usable in written English.
It can be used when discussing techniques or strategies for including something within a process or system.
Example: "The research outlines a method of incorporating sustainable practices into traditional manufacturing processes."
Alternatives: "a technique for integrating" or "an approach to including".
The fundamental contribution of the work presented in this paper is the proposition of a method of incorporating shape knowledge into the system discussed in [4].
This paper proposes a method of incorporating a real-valued mutation (RVM) operator into the PSO algorithms, aimed at enhancing global search capability.
Further, we go on to show a method of incorporating the empirical FRF uncertainty into the cost for robustness against plant uncertainty.
This paper addresses a method of incorporating dislocation ensembles in the crystal plasticity constitutive framework, while accounting for their evolution during changing strain paths.
Nanoemulsions present benefits such as an increase in the bioavailability, solubility and targeted delivery of encapsulated substances, and thus, they are a method of incorporating high nutritional value oils, such as high-oleic palm oil (HOPO).
We therefore devised a method of incorporating the nonlinear light response (NLR) that is apparent within stands into the model, while preserving the linearity in the relationship between annual Pg and Qa across stands that is assumed in conventional PEMs.
Defining a mean and uncertainty interval for the AFR index of each chemical being ranked provides a practical method of incorporating data uncertainty into a regulatory protocol.
A similar method of incorporating LCA results in MCDA has been applied by Prado-Lopez et al. [33].
A second method of incorporating pharmacophores into virtual screening is to post-process docking results with various kinds of ligand interaction-based filters.
This paper devises a hybrid method of incorporating machine learning techniques together to detect high and low yields in semiconductor manufacturing.
