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The deposition was performed on a hot stage at 90 °C.
The squeeze was achieved using the gap control motor of a hot stage conventionally used for shear measurements.
Material samples were heated to melt fully into very thin film on a hot stage at the temperature of 200 °C, and then squeezed between cover glasses.
Using atomic force microscopy (AFM) coupled with a hot stage, we studied the morphological evolution of superheated poly ethylene oxide) (PEO) crystal monolayer on the mica surface.
Using AFM with a hot stage the samples on the surface of silicon wafer were isothermally crystallized at 20.0 ≤ Tc ≤ 60.0 °C.
The gelatinization behaviour of starch with glycerol/H2O was investigated and the gelatinized temperature (Tgel) was determined using a polarized optical microscopy (POM) equipped with a hot stage.
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Melting was observed in a hot-stage reflected light microscope.
The use of a hot-stage allowed us to perform real-time observation of growth faces in different crystallographic directions.
Besides, POM equipped with a hot-stage was used to examine the morphology during the crystal growth.
Microstructure evolution during non-isothermal annealing from room temperature to 450 °C was performed using in-situ heating via a hot-stage transmission electron microscope.
The growth behavior of the rod-like α-form crystals from both the liquid crystal and the isotropic melt state was studied in situ and in real time using a hot-stage atomic force microscopy.
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