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b d SEM photos of reference-untreated b, IR c and UV d irradiated technical samples at the above-mentioned parameters.
Nevertheless, the use of IR laser beams both on technical samples simulating pollution encrustation, as well as on real marble fragments with pollution crusts, often resulted in surfaces discoloured to yellow brown.
The methodology has been thoroughly tested through a series of studies, both on technical samples and real fragments [18, 30, 31], in order to determine the optimal conditions for its application.
A series of studies on technical samples and real fragments aimed at defining and refining this methodology in order to ensure that the original surface, including its details and historic traces, will be safeguarded.
A series of preliminary experiments, which took place on technical samples made of gypsum (CaSO4 2H2O) and 5 10 % wt of charcoal particulates (with size in the range of 50 150 μm) in a simplistic simulation of pollution crusts, aimed at studying the removal mechanisms of the pollution crusts in this IR regime (1064 nm, 30 ns).
Taking into account the cleaning requirements and the nature of encrustations and substrates stratigraphy, as well as the results of previous studies on technical samples and real fragments, IESL-FORTH suggested the combination of the two mechanisms in an attempt to reach an optimum cleaning result.
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Assumptions were made to transfer the pollen deposition measurements from this technical sampling to pollen density on Urtica leaves.
The relationship between the results of standardised technical sampling using the PMF sampler and leaf pollen density measurements was experimentally evaluated based on parallel field measurements.
Hofmann et al. [2] focused on the distance relationship in pollen deposition as measured by the PMF standardised technical sampling method.
The work modelled pollen dispersal for all maize fields in the area and evaluated pollen deposition using standardised technical sampling as well as direct measurements of plant leaves.
To obtain comparable data, specific leaf deposition data must be complemented with parallel pollen measurements acquired using standardised technical sampling methods.
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